- Manufacture :
- Part Status :
- Operating Temperature :
- Supplier Device Package :
- Supply Voltage :
- Logic Type :
-
- 8-Bit to 9-Bit Parity Bus Transceiver (1)
- Addressable Scan Ports (2)
- Arithmetic Logic Unit (3)
- Buffer/Driver with Parity (1)
- Embedded Test-Bus Controllers (1)
- Scan Test Device with Buffers (2)
- Scan Test Device with Bus Transceivers (3)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (1)
- Scan Test Device with D-Type Latches (1)
- Scan Test Device with Inverting Buffers (1)
- Voltage Clamp (1)
- Applied Filters :
17 results
| Picture | Mfr Part # | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| GLOBAL STOCKS | |||||||||||||||||
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VIEW |
1,582
In-stock
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NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24SOIC | 74F | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
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VIEW |
1,519
In-stock
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Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 74LVT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 8 | Embedded Test-Bus Controllers | |||
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VIEW |
1,244
In-stock
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Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 160-NFBGA (9x13) | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | |||
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VIEW |
2,517
In-stock
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Texas Instruments | IC 10-BIT SCAN PORT XCVR 24-SOIC | 74LVT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 10 | Addressable Scan Ports | |||
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|
VIEW |
3,029
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
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|
VIEW |
972
In-stock
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Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
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|
VIEW |
2,187
In-stock
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Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
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|
VIEW |
2,054
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
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|
VIEW |
2,497
In-stock
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Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
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|
VIEW |
2,047
In-stock
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Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 74AS | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | |||
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|
VIEW |
2,638
In-stock
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Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 74AS | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | |||
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|
VIEW |
962
In-stock
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Texas Instruments | IC SCAN TEST DEV/TXRX 24-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
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|
VIEW |
3,794
In-stock
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Texas Instruments | IC ARITHMETIC LOGIC UNIT 24SOIC | 74AS | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | |||
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|
VIEW |
889
In-stock
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
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VIEW |
2,326
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
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|
VIEW |
2,301
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
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|
VIEW |
2,875
In-stock
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Texas Instruments | IC 10BIT VOLTAGE CLAMP 24-SOIC | - | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | - | 10 | Voltage Clamp | |||
