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22 results
| Picture | Mfr Part # | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| GLOBAL STOCKS | |||||||||||||||||
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VIEW |
3,734
In-stock
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NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SSOP | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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VIEW |
1,356
In-stock
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NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SOIC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SO | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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VIEW |
1,560
In-stock
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NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28PLCC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC (11.51x11.51) | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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VIEW |
1,244
In-stock
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Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 160-NFBGA (9x13) | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | |||
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VIEW |
3,918
In-stock
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Texas Instruments | IC ADDRESSABLE SCAN PORT 24TSSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | |||
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VIEW |
2,912
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | |||
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VIEW |
2,644
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | |||
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VIEW |
2,054
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
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VIEW |
3,543
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | |||
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VIEW |
962
In-stock
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Texas Instruments | IC SCAN TEST DEV/TXRX 24-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
|
VIEW |
2,438
In-stock
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ON Semiconductor | TXRX W/GENERATOR&CHECKER 28PLCC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC (11.5x11.5) | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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VIEW |
1,269
In-stock
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ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SOIC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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VIEW |
827
In-stock
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ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SSOP | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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VIEW |
1,191
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SSOP | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
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VIEW |
2,546
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
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VIEW |
1,363
In-stock
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Texas Instruments | IC SCAN TEST DEV/TXRX 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
|
VIEW |
3,903
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | |||
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VIEW |
2,599
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | |||
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VIEW |
1,802
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | |||
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VIEW |
3,690
In-stock
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Texas Instruments | IC SCAN TEST DEV/TXRX 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
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VIEW |
3,330
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | |||
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VIEW |
3,118
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | |||
