Picture Mfr Part # QUANTITY Inventory MANUFACTURE Description Package Series Part Status Packaging Operating Temperature Mounting Type Package / Case Supplier Device Package Supply Voltage Number of Bits Logic Type
GLOBAL STOCKS
74F181SPC
RFQ
VIEW
RFQ
3,466
In-stock
ON Semiconductor IC ARITHMETIC LOGIC 4BIT 24-DIP 74F Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 4 Arithmetic Logic Unit
74F181PC
RFQ
VIEW
RFQ
3,476
In-stock
ON Semiconductor IC ARITHMETIC LOGIC 4BIT 24-DIP 74F Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.600", 15.24mm) 24-PDIP 4.5 V ~ 5.5 V 4 Arithmetic Logic Unit
SN74BCT8374ANTG4
RFQ
VIEW
RFQ
1,666
In-stock
Texas Instruments IC SCAN TEST DEVICE W/FF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ANT
RFQ
VIEW
RFQ
1,188
In-stock
Texas Instruments IC SCAN TEST DEVICE W/FF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8373ANT
RFQ
VIEW
RFQ
806
In-stock
Texas Instruments IC SCAN TEST DEVICE LATCH 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Latches
SN74BCT8245ANTG4
RFQ
VIEW
RFQ
846
In-stock
Texas Instruments IC SCAN TEST DEVICE TXRX 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Bus Transceivers
SN74BCT8245ANT
RFQ
VIEW
RFQ
3,810
In-stock
Texas Instruments IC SCAN TEST DEVICE TXRX 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Bus Transceivers
SN74BCT8244ANTG4
RFQ
VIEW
RFQ
2,817
In-stock
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Buffers
SN74BCT8244ANT
RFQ
VIEW
RFQ
2,739
In-stock
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Buffers
SN74BCT8240ANTG4
RFQ
VIEW
RFQ
3,609
In-stock
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Inverting Buffers
SN74BCT8240ANT
RFQ
VIEW
RFQ
2,795
In-stock
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Inverting Buffers
SN74BCT29854NT
RFQ
VIEW
RFQ
3,663
In-stock
Texas Instruments IC TRANSCEIVER 1-9BIT 24DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 8-Bit to 9-Bit Parity Bus Transceiver
SN74AS181ANTG4
RFQ
VIEW
RFQ
2,075
In-stock
Texas Instruments IC ARITHMETIC LOGIC UNIT 24DIP 74AS Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V - Arithmetic Logic Unit
SN74AS181ANT
RFQ
VIEW
RFQ
3,881
In-stock
Texas Instruments IC ARITHMETIC LOGIC UNIT 24DIP 74AS Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V - Arithmetic Logic Unit
MC10H330PG
RFQ
VIEW
RFQ
3,026
In-stock
ON Semiconductor IC DRIVER/RCVR QUAD BUS 24-DIP 10H Obsolete Tube 0°C ~ 75°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP - 4 Driver/Receiver
MC10H330P
RFQ
VIEW
RFQ
3,483
In-stock
ON Semiconductor IC DRIVER/RCVR QUAD BUS 24-DIP 10H Obsolete Tube 0°C ~ 75°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP - 4 Driver/Receiver
SN74LS181NG4
RFQ
VIEW
RFQ
3,432
In-stock
Texas Instruments IC ARTHMTC UNIT/FUN GEN 24-DIP 74LS Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.600", 15.24mm) 24-PDIP 4.75 V ~ 5.25 V - Arithmetic Logic Unit
SN74LS181N
RFQ
VIEW
RFQ
3,971
In-stock
Texas Instruments IC ARTHMTC UNIT/FUN GEN 24-DIP 74LS Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.600", 15.24mm) 24-PDIP 4.75 V ~ 5.25 V - Arithmetic Logic Unit