Picture Mfr Part # QUANTITY Inventory MANUFACTURE Description Package Series Part Status Packaging Operating Temperature Mounting Type Package / Case Supplier Device Package Supply Voltage Number of Bits Logic Type
GLOBAL STOCKS
SN74BCT8373ANT
RFQ
VIEW
RFQ
806
In-stock
Texas Instruments IC SCAN TEST DEVICE LATCH 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Latches
SN74BCT8373ADWRE4
RFQ
VIEW
RFQ
2,454
In-stock
Texas Instruments IC SCAN TEST DEVICE LATCH 24SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Latches
SN74BCT8373ADWR
RFQ
VIEW
RFQ
3,808
In-stock
Texas Instruments IC SCAN TEST DEVICE LATCH 24SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Latches
SN74BCT8373ADWRG4
RFQ
VIEW
RFQ
3,241
In-stock
Texas Instruments IC SCAN TEST DEVICE 24SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Latches