Picture Mfr Part # QUANTITY Inventory MANUFACTURE Description Package Series Part Status Packaging Operating Temperature Mounting Type Package / Case Supplier Device Package Supply Voltage Number of Bits Logic Type
GLOBAL STOCKS
SN74BCT8240ANTG4
RFQ
VIEW
RFQ
3,609
In-stock
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Inverting Buffers
SN74BCT8240ANT
RFQ
VIEW
RFQ
2,795
In-stock
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Inverting Buffers
SN74BCT8240ADWRE4
RFQ
VIEW
RFQ
2,312
In-stock
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with Inverting Buffers
SN74BCT8240ADWR
RFQ
VIEW
RFQ
3,215
In-stock
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with Inverting Buffers
SN74BCT8240ADWRG4
RFQ
VIEW
RFQ
3,912
In-stock
Texas Instruments IC SCAN TEST DEVICE 24SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with Inverting Buffers